Project Description
Project Overview: The nature of back-switching in BiFeO3 was revealed using monodomain epitaxial thin films with different orientations. Current researchers have found that switching cannot be maintained in thin films. Back-switching (from 71o to 180o) is caused by mechanical stress and is countered by ferroelastic relaxation. This project will conduct a design of experiments for BFO crystallographic analysis, such as reciprocal space mapping (RSM), for various time intervals of several thin film BiFeO3 samples of different thicknesses. These analysis will enable the study of back-switching behavior over time.
Client: Dr. Chang-Beom Eom, Research Professor, Department of Materials Science and Engineering, University of Wisconsin-Madison
Advisors: Jon Schad, Thomas Tybell, Graduate students, University of Wisconsin-Madison
Team: Majed Alawami, malawami@wisc.edu (Leader)
Hassan Alramadhan, alramadhan@wisc.edu (Researcher, Accountant, Budget)
Mohammed Bahabri, bahabri@wisc.edu (Technical Engineer)
Faisal Aljamaan, aljamaan@wisc.edu (Communicator)
